AlGaN/GaN HEMT能帶工程和界面調制AlGaN/GaN HEMT energy band engineering and interface modulation胡衛國中國科學院北京納米能源與系統研究所研究員HU WeiguoProfessor of Beijing Institute of Nanoenergy and Systems, Chinese Academy of Sciences
4H-SiC MOSFET中界面碳團簇的形成和遷移率退化機理Interfacial Carbon Cluster Formation and Mobility Degradation in 4H-SiC MOSFETs張召富武漢大學工業科學研究院研究員ZHANG ZhaofuProfessor of The Institute of Technological Sciences, Wuhan University
